Characterisation of reliability of compound semiconductor devices using electrical pulses
M. Brandt, V. Krozer, M. Schüβler, K.-H. Bock, H.-L. HartnagelVolume:
36
Year:
1996
Language:
english
Pages:
4
DOI:
10.1016/0026-2714(96)00222-3
File:
PDF, 343 KB
english, 1996