Characterisation of reliability of compound semiconductor...

Characterisation of reliability of compound semiconductor devices using electrical pulses

M. Brandt, V. Krozer, M. Schüβler, K.-H. Bock, H.-L. Hartnagel
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Volume:
36
Year:
1996
Language:
english
Pages:
4
DOI:
10.1016/0026-2714(96)00222-3
File:
PDF, 343 KB
english, 1996
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