![](/img/cover-not-exists.png)
Scaling down and reliability problems of gigabit CMOS circuits
W.H. Krautschneider, A. Kohlhase, H. TerletzkiVolume:
37
Year:
1997
Language:
english
Pages:
19
DOI:
10.1016/0026-2714(96)00236-3
File:
PDF, 1.08 MB
english, 1997