Use of In Situ Atomic Force Microscopy to Follow Phase...

Angewandte Chemie International Edition 2013 / 09 Vol. 52; Iss. 40

Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time

Thakuria, Ranjit, Eddleston, Mark D., Chow, Ernest H. H., Lloyd, Gareth O., Aldous, Barry J., Krzyzaniak, Joseph F., Bond, Andrew D., Jones, William
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Volume:
52
Language:
english
Journal:
Angewandte Chemie International Edition
DOI:
10.1002/anie.201302532
Date:
September, 2013
File:
PDF, 1.85 MB
english, 2013
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