Antisite defects in n-type Bi2(Te,Se)3: Experimental and theoretical studies
Oh, M. W., Son, J. H., Kim, B. S., Park, S. D., Min, B. K., Lee, H. W.Volume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4870818
Date:
April, 2014
File:
PDF, 719 KB
english, 2014