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Investigations on the Vulnerability of Advanced CMOS Technologies to MGy Dose Environments
Gaillardin, M., Girard, S., Paillet, P., Leray, J. L., Goiffon, V., Magnan, P., Marcandella, C., Martinez, M., Raine, M., Duhamel, O., Richard, N., Andrieu, F., Barraud, S., Faynot, O.Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2249095
Date:
August, 2013
File:
PDF, 1.10 MB
english, 2013