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[IEEE 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1994)] Proceedings of 1994 IEEE International Electron Devices Meeting - Device integration for ESD robustness of high voltage power MOSFETs
Duvvury, C., Rodriguez, J., Jones, C., Smayling, M.Year:
1994
Language:
english
DOI:
10.1109/IEDM.1994.383381
File:
PDF, 326 KB
english, 1994