[IEEE 2008 37th IEEE Applied Imagery Pattern Recognition...

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[IEEE 2008 37th IEEE Applied Imagery Pattern Recognition Workshop - Washington, DC, USA (2008.10.15-2008.10.17)] 2008 37th IEEE Applied Imagery Pattern Recognition Workshop - A comparative study of multilinear principal component analysis for face recognition

Jin Wang,, Yu Chen,, Adjouadi, Malek
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Year:
2008
Language:
english
DOI:
10.1109/AIPR.2008.4906476
File:
PDF, 197 KB
english, 2008
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