![](/img/cover-not-exists.png)
[IEEE 2008 37th IEEE Applied Imagery Pattern Recognition Workshop - Washington, DC, USA (2008.10.15-2008.10.17)] 2008 37th IEEE Applied Imagery Pattern Recognition Workshop - A comparative study of multilinear principal component analysis for face recognition
Jin Wang,, Yu Chen,, Adjouadi, MalekYear:
2008
Language:
english
DOI:
10.1109/AIPR.2008.4906476
File:
PDF, 197 KB
english, 2008