Characterizing the Effects of Single Event Upsets on...

Characterizing the Effects of Single Event Upsets on Synchronous Data Paths

Berg, Melanie, Friendlich, Mark, Kim, Hak, Seidlick, Christina, LaBel, Kenneth, Ladbury, Ray, Pellish, Jonathan
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2273938
Date:
August, 2013
File:
PDF, 1.27 MB
english, 2013
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