Characterizing the Effects of Single Event Upsets on Synchronous Data Paths
Berg, Melanie, Friendlich, Mark, Kim, Hak, Seidlick, Christina, LaBel, Kenneth, Ladbury, Ray, Pellish, JonathanVolume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2273938
Date:
August, 2013
File:
PDF, 1.27 MB
english, 2013