Real-Time Beam Profile Uniformity Monitoring System
Britvitch, I., Hajdas, W., Scherrer, S., Egli, K., Mozzanica, A., Schmitt, B.Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2280032
Date:
October, 2013
File:
PDF, 391 KB
english, 2013