![](/img/cover-not-exists.png)
Dislocation Density Reduction During Impurity Gettering in Multicrystalline Silicon
Choi, H. J., Bertoni, M. I., Hofstetter, J., Fenning, D. P., Powell, D. M., Castellanos, S., Buonassisi, T.Volume:
3
Language:
english
Journal:
IEEE Journal of Photovoltaics
DOI:
10.1109/JPHOTOV.2012.2219851
Date:
January, 2013
File:
PDF, 1.65 MB
english, 2013