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Depth profiling of GaN by cathodoluminescence microanalysis
Fleischer, K., Toth, M., Phillips, M. R., Zou, J., Li, G., Chua, S. J.Volume:
74
Year:
1999
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.123460
File:
PDF, 807 KB
english, 1999