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CMOS Circuits to Measure Timing Jitter Using a Self-Referenced Clock and a Cascaded Time Difference Amplifier With Duty-Cycle Compensation
Niitsu, Kiichi, Sakurai, Masato, Harigai, Naohiro, Yamaguchi, Takahiro J., Kobayashi, HaruoVolume:
47
Language:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/JSSC.2012.2211655
Date:
November, 2012
File:
PDF, 2.43 MB
english, 2012