Raman characterization and stress analysis of AlN:Er3+...

Materials Science and Engineering: B 2014 / 09 Vol. 187

Raman characterization and stress analysis of AlN:Er3+ epilayers grown on sapphire and silicon substrates

Kallel, T., Dammak, M., Wang, J., Jadwisienczak, W.M.
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Volume:
187
Language:
english
Journal:
Materials Science and Engineering: B
DOI:
10.1016/j.mseb.2014.04.003
Date:
September, 2014
File:
PDF, 925 KB
english, 2014
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