[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Faster-than-at-speed test for increased test quality and in-field reliability
Yoneda, Tomokazu, Hori, Keigo, Inoue, Michiko, Fujiwara, HideoYear:
2011
Language:
english
DOI:
10.1109/TEST.2011.6139131
File:
PDF, 350 KB
english, 2011