Dielectric spectroscopy at the nanoscale by atomic force...

Journal of Applied Physics 2014 / 05 Vol. 115; Iss. 18

Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response

Miccio, Luis A., Kummali, Mohammed M., Schwartz, Gustavo A., Alegría, Ángel, Colmenero, Juan
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Volume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4875836
Date:
May, 2014
File:
PDF, 2.24 MB
english, 2014
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