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[IEEE 2013 IEEE/ACM 28th International Conference on Automated Software Engineering (ASE) - Silicon Valley, CA, USA (2013.11.11-2013.11.15)] 2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE) - Using automatically generated invariants for regression testing and bug localization
Sagdeo, Parth, Ewalt, Nicholas, Pal, Debjit, Vasudevan, ShobhaYear:
2013
Language:
english
DOI:
10.1109/ASE.2013.6693125
File:
PDF, 351 KB
english, 2013