[IEEE 2010 21st IEEE International Symposium on Rapid System Prototyping (RSP) - Fairfax, VA, USA (2010.06.8-2010.06.11)] Proceedings of 2010 21st IEEE International Symposium on Rapid System Protyping - Failure mode and effect analysis based on electric and electronic architectures of vehicles to support the safety lifecycle ISO/DIS 26262

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