Comparison of methods to quantify interface trap densities...

Comparison of methods to quantify interface trap densities at dielectric/III-V semiconductor interfaces

Engel-Herbert, Roman, Hwang, Yoontae, Stemmer, Susanne
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Volume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3520431
File:
PDF, 3.07 MB
english, 2010
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