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Comparison of methods to quantify interface trap densities at dielectric/III-V semiconductor interfaces
Engel-Herbert, Roman, Hwang, Yoontae, Stemmer, SusanneVolume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3520431
File:
PDF, 3.07 MB
english, 2010