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[IEEE 2013 14th International Vacuum Electronics Conference (IVEC) - Paris, France (2013.05.21-2013.05.23)] 2013 IEEE 14th International Vacuum Electronics Conference (IVEC) - Lifetime and reliability analysis of klystrons
Balkcum, Adam, Habermann, ThomasYear:
2013
Language:
english
DOI:
10.1109/IVEC.2013.6570967
File:
PDF, 611 KB
english, 2013