[IEEE 2013 IEEE International Test Conference (ITC) -...

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[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Self-repair of uncore components in robust system-on-chips: An OpenSPARC T2 case study

Li, Yanjing, Cheng, Eric, Makar, Samy, Mitra, Subhasish
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Year:
2013
Language:
english
DOI:
10.1109/TEST.2013.6651907
File:
PDF, 1.16 MB
english, 2013
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