[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - An optimization approach for safety instrumented system design
Machleidt, Konstantin, Litz, LotharYear:
2011
Language:
english
DOI:
10.1109/RAMS.2011.5754503
File:
PDF, 402 KB
english, 2011