Transmission Electron Microscopy Investigations of Metal-Impurity-Related Defects in Crystalline Silicon
Seibt, Michael, Saring, Philipp, Hahne, Philipp, Stolze, Linda, Falkenberg, M.A., Rudolf, Carsten, Abdelbarey, Doaa, Schuhmann, HenningVolume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.178-179.275
Date:
August, 2011
File:
PDF, 3.29 MB
english, 2011