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Scanning X-Ray Excited Optical Luminescence Microscopy as a New Tool for the Analysis of Recombination Active Defects in Multi-Crystalline Silicon
Trushin, Maxim, Vyvenko, O.F., Seifert, Winfried, Klossek, André, Zizak, Ivo, Kittler, MartinVolume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.178-179.301
Date:
August, 2011
File:
PDF, 1.21 MB
english, 2011