Scanning X-Ray Excited Optical Luminescence Microscopy as a...

Scanning X-Ray Excited Optical Luminescence Microscopy as a New Tool for the Analysis of Recombination Active Defects in Multi-Crystalline Silicon

Trushin, Maxim, Vyvenko, O.F., Seifert, Winfried, Klossek, André, Zizak, Ivo, Kittler, Martin
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.178-179.301
Date:
August, 2011
File:
PDF, 1.21 MB
english, 2011
Conversion to is in progress
Conversion to is failed