[IEEE 2013 14th International Vacuum Electronics Conference (IVEC) - Paris, France (2013.05.21-2013.05.23)] 2013 IEEE 14th International Vacuum Electronics Conference (IVEC) - Rayleigh scattering measurement of residual gas inside microwave vacuum electronic devices
Yuan, Hui-yu, Wu, Chen, Wang, Feng, Bai, Ningfeng, Fan, Hehong, Wei, Pu, Zhao, Xinqun, Sun, Xiao-hanYear:
2013
Language:
english
DOI:
10.1109/IVEC.2013.6571099
File:
PDF, 669 KB
english, 2013