[IEEE 2013 14th International Vacuum Electronics Conference...

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[IEEE 2013 14th International Vacuum Electronics Conference (IVEC) - Paris, France (2013.05.21-2013.05.23)] 2013 IEEE 14th International Vacuum Electronics Conference (IVEC) - Rayleigh scattering measurement of residual gas inside microwave vacuum electronic devices

Yuan, Hui-yu, Wu, Chen, Wang, Feng, Bai, Ningfeng, Fan, Hehong, Wei, Pu, Zhao, Xinqun, Sun, Xiao-han
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Year:
2013
Language:
english
DOI:
10.1109/IVEC.2013.6571099
File:
PDF, 669 KB
english, 2013
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