[IEEE 2013 14th International Vacuum Electronics Conference...

  • Main
  • [IEEE 2013 14th International Vacuum...

[IEEE 2013 14th International Vacuum Electronics Conference (IVEC) - Paris, France (2013.05.21-2013.05.23)] 2013 IEEE 14th International Vacuum Electronics Conference (IVEC) - Performance degradation simulation for M-type cathode based on ion bombardment

Shi, Xiaolian, Fan, Hehong, Song, Fangfang, Zhao, Xingqun, Wan, Suiren, Sun, Xiaohan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2013
Language:
english
DOI:
10.1109/IVEC.2013.6571103
File:
PDF, 703 KB
english, 2013
Conversion to is in progress
Conversion to is failed