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[IEEE 2013 14th International Vacuum Electronics Conference (IVEC) - Paris, France (2013.05.21-2013.05.23)] 2013 IEEE 14th International Vacuum Electronics Conference (IVEC) - Performance degradation simulation for M-type cathode based on ion bombardment
Shi, Xiaolian, Fan, Hehong, Song, Fangfang, Zhao, Xingqun, Wan, Suiren, Sun, XiaohanYear:
2013
Language:
english
DOI:
10.1109/IVEC.2013.6571103
File:
PDF, 703 KB
english, 2013