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[IEEE 2008 IEEE International Conference on Mechatronics and Automation (ICMA) (Formerly ICIMA) - Takamatsu, Japan (2008.08.5-2008.08.8)] 2008 IEEE International Conference on Mechatronics and Automation - Interpretation of nevirapine concentration from immunochromatographic strip test using support vector regression
Sumonphan, Ekkalak, Auephanwiriyakul, Sansanee, Theera-Umpon, NiponYear:
2008
Language:
english
DOI:
10.1109/ICMA.2008.4798830
File:
PDF, 471 KB
english, 2008