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On the computation of diffraction peaks from discrete defects in continuous media: comparison of displacement and strain-based methods
Upadhyay, Manas Vijay, Capolungo, Laurent, Balogh, LeventeVolume:
47
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576714005500
Date:
June, 2014
File:
PDF, 2.26 MB
english, 2014