In-Depth Electromagnetic Analysis of ESD Protection for...

IEEE Transactions on Electron Devices 2014 / 6 Vol. 61; Iss. 6

In-Depth Electromagnetic Analysis of ESD Protection for Advanced CMOS Technology During Fast Transient and High-Current Surge

Galy, Philippe, Schoenmaker, Wim
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2314485
Date:
June, 2014
File:
PDF, 2.68 MB
english, 2014
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