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On the Electrostatic Discharge Robustness of Graphene
Li, Hong, Russ, Christian C., Liu, Wei, Johnsson, David, Gossner, Harald, Banerjee, KaustavVolume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2315235
Date:
June, 2014
File:
PDF, 3.57 MB
english, 2014