Time-Dependent 3-D Statistical KMC Simulation of...

IEEE Transactions on Electron Devices 2014 / 6 Vol. 61; Iss. 6

Time-Dependent 3-D Statistical KMC Simulation of Reliability in Nanoscale MOSFETs

Amoroso, Salvatore Maria, Gerrer, Louis, Hussin, Razaidi, Adamu-Lema, Fikru, Asenov, Asen
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2318172
Date:
June, 2014
File:
PDF, 5.82 MB
english, 2014
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