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Performance Benchmarking and Effective Channel Length for Nanoscale InAs, ${\rm In}_{0.53}{\rm Ga}_{0.47}{\rm As}$ , and sSi n-MOSFETs
Lizzit, Daniel, Esseni, David, Palestri, Pierpaolo, Osgnach, Patrik, Selmi, LucaVolume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2315919
Date:
June, 2014
File:
PDF, 1.82 MB
english, 2014