Simulation Study of the Trapping Properties of ${\rm...

IEEE Transactions on Electron Devices 2014 / 6 Vol. 61; Iss. 6

Simulation Study of the Trapping Properties of ${\rm HfO}_{2}$ -Based Charge-Trap Memory Cells

Driussi, Francesco, Spiga, Sabina, Lamperti, Alessio, Congedo, Gabriele, Gambi, Alberto
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2316374
Date:
June, 2014
File:
PDF, 2.58 MB
english, 2014
Conversion to is in progress
Conversion to is failed