A Low Dark Leakage Current High-Sensitivity CMOS Image Sensor With STI-Less Shared Pixel Design
Seo, Min-Woong, Kawahito, Shoji, Yasutomi, Keita, Kagawa, Keiichiro, Teranishi, NobukazuVolume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2318522
Date:
June, 2014
File:
PDF, 3.09 MB
english, 2014