Temperature-Dependent Instability of Bias Stress in InGaZnO...

IEEE Transactions on Electron Devices 2014 / 6 Vol. 61; Iss. 6

Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors

Chang, Geng-Wei, Chang, Ting-Chang, Jhu, Jhe-Ciou, Tsai, Tsung-Ming, Chang, Kuan-Chang, Syu, Yong-En, Tai, Ya-Hsiang, Jian, Fu-Yen, Hung, Ya-Chi
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2319105
Date:
June, 2014
File:
PDF, 2.79 MB
english, 2014
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