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Laser SEE Sensitivity Mapping of SRAM Cells
Chugg, A. M., Burnell, A. J., Moutrie, M. J., Jones, R., Harboe-SØrensen, R.Volume:
54
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2007.909514
Date:
December, 2007
File:
PDF, 1.45 MB
english, 2007