Modeling Resistance Instabilities of Set and Reset States...

IEEE Transactions on Electron Devices 2014 / 6 Vol. 61; Iss. 6

Modeling Resistance Instabilities of Set and Reset States in Phase Change Memory With Ge-Rich GeSbTe

Ciocchini, Nicola, Palumbo, Elisabetta, Borghi, Massimo, Zuliani, Paola, Annunziata, Roberto, Ielmini, Daniele
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2313889
Date:
June, 2014
File:
PDF, 2.60 MB
english, 2014
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