Full-wavefield migration of vertical seismic profiling...

Full-wavefield migration of vertical seismic profiling data: using all multiples to extend the illumination area

Soni, A.K., Verschuur, D.J.
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Volume:
62
Language:
english
Journal:
Geophysical Prospecting
DOI:
10.1111/1365-2478.12130
Date:
July, 2014
File:
PDF, 2.18 MB
english, 2014
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