[IEEE 2014 27th International Conference on VLSI Design -...

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[IEEE 2014 27th International Conference on VLSI Design - India (2014.01.5-2014.01.9)] 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems - Tutorial T3A: Testing Low-Power Integrated Circuits: Challenges, Solutions, and Industry Practices

Ravi, Srivaths, Chickermane, Vivek, Chakravadhanula, Krishna
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Year:
2014
Language:
english
DOI:
10.1109/VLSID.2014.117
File:
PDF, 193 KB
english, 2014
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