An integrated environment for technology closure of deep-submicron IC designs
Trevillyan, L., Kung, D., Puri, R., Reddy, L.N., Kazda, M.A.Volume:
21
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/MDT.2004.1261846
Date:
January, 2004
File:
PDF, 334 KB
english, 2004