[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Study of the Impact of Electron Traps on GaN HEMT Reliability
Katzer, D. Scott, Mittereder, Jeffrey, Binari, Steven, Storm, David, Roussos, Jason, Klein, PaulVolume:
3
Year:
2006
Language:
english
DOI:
10.1149/1.2357205
File:
PDF, 418 KB
english, 2006