Single-Event Burnout Hardening of Power UMOSFETs With...

IEEE Transactions on Electron Devices 2014 / 5 Vol. 61; Iss. 5

Single-Event Burnout Hardening of Power UMOSFETs With Integrated Schottky Diode

Ying Wang,, Cheng-Hao Yu,, Zheng Dou,, Wei Xue,
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2312948
Date:
May, 2014
File:
PDF, 1.31 MB
english, 2014
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