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Engineering the Electron–Hole Bilayer Tunneling Field-Effect Transistor
Agarwal, Sapan, Teherani, James T., Hoyt, Judy L., Antoniadis, Dimitri A., Yablonovitch, EliVolume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2312939
Date:
May, 2014
File:
PDF, 1.71 MB
english, 2014