[IEEE 2011 37th IEEE Photovoltaic Specialists Conference (PVSC) - Seattle, WA, USA (2011.06.19-2011.06.24)] 2011 37th IEEE Photovoltaic Specialists Conference - Characterization of CIGS grain boundaries using Atom Probe Tomography
Cojocaru-Miredin, Oana, Choi, Pyuck-Pa, Abou-Ras, Daniel, Raabe, DierkYear:
2011
Language:
english
DOI:
10.1109/PVSC.2011.6186338
File:
PDF, 527 KB
english, 2011