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[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Thermal reliability of power insulated gate bipolar transistor (IGBT) modules
Wuchen Wu,, Guo Gao,, Limin Dong,, Zhengyuan Wang,, Held, M., Jacob, P., Scacco, P.Year:
1996
Language:
english
DOI:
10.1109/STHERM.1996.545103
File:
PDF, 511 KB
english, 1996