Hall-Effect Measurements Probing the Degree of Charge-Carrier Delocalization in Solution-Processed Crystalline Molecular Semiconductors
Chang, Jui-Fen, Sakanoue, Tomo, Olivier, Yoann, Uemura, Takafumi, Dufourg-Madec, Marie-Beatrice, Yeates, Stephen G., Cornil, Jérôme, Takeya, Jun, Troisi, Alessandro, Sirringhaus, HenningVolume:
107
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/PhysRevLett.107.066601
Date:
August, 2011
File:
PDF, 1.00 MB
english, 2011