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Atomic Force Microscopy and Kelvin Probe Force Microscopy Measurements of Semiconductor Surface Using Carbon Nanotube Tip Fabricated by Electrophoresis
Maeda, Chikashi, Ozeki, Norihito, Kishimoto, Shigeru, Mizutani, Takashi, Sugai, Toshiki, Shinohara, HisanoriVolume:
41
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.41.2615
Date:
April, 2002
File:
PDF, 140 KB
english, 2002