[IEEE 2013 IEEE International Conference on Mechatronics and Automation (ICMA) - Takamatsu, Kagawa, Japan (2013.08.4-2013.08.7)] 2013 IEEE International Conference on Mechatronics and Automation - Dynamic fault diagnosis in chemical process based on SVM-HMM
Peng, Yi, Zhang, Xiaodan, Han, Zhenjun, Jiao, JianbinYear:
2013
Language:
english
DOI:
10.1109/ICMA.2013.6618169
File:
PDF, 849 KB
english, 2013