X-ray Photoelectron Spectroscopy and Time-of-Flight SIMS...

Langmuir 1997 / 05 Vol. 13; Iss. 10

X-ray Photoelectron Spectroscopy and Time-of-Flight SIMS Investigations of Hyaluronic Acid Derivatives

Shard, A. G., Davies, M. C., Tendler, S. J. B., Bennedetti, L., Purbrick, M. D., Paul, A. J., Beamson, G.
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Volume:
13
Language:
english
Journal:
Langmuir
DOI:
10.1021/la960050a
Date:
May, 1997
File:
PDF, 226 KB
english, 1997
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