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[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Tantalum and Niobium oxide capacitors: Field crystallization, leakage current kinetics and reliability
Sedlakova, V., Sikula, J., Majzner, J., Navarova, H., Chvatal, M., Zednicek, T.Year:
2010
Language:
english
DOI:
10.1109/MIEL.2010.5490447
File:
PDF, 327 KB
english, 2010