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Background Calibration With Piecewise Linearized Error Model for CMOS Pipeline A/D Converter
Jie Yuan,, Farhat, N.H., Van der Spiegel, J.Volume:
55
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/TCSI.2007.910645
Date:
February, 2008
File:
PDF, 1.30 MB
english, 2008